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| STRUCTURE DETERMINATION | home > what do our scientists do > structure determination | |||||||||||||||||
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When an X-ray beam strikes a crystal, the incident radiation is scattered in many directions to form a distinctive diffraction pattern that is characteristic of the atomic arrangement within the crystal. The intensities of the scattered X-rays can be measured when they strike a photographic film or electronic recorder. However, X-rays, like light or sound, are wavelike in nature, and their intensities vary with time. In order to work backwards from the diffraction pattern to the molecular structure, it is necessary to know not only the intensity, but also the relative timing or phase when each wave hits the recording device. Inability to measure the phase angles experimentally gives rise to the so-called phase problem of X-ray crystallography. | |||||||||||||||||
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